Surgery – Diagnostic testing – Sensitivity to electric stimulus
Reexamination Certificate
2005-08-30
2005-08-30
Hindenburg, Max F. (Department: 3736)
Surgery
Diagnostic testing
Sensitivity to electric stimulus
Reexamination Certificate
active
06936012
ABSTRACT:
A novel application of independent component analysis (ICA) to data acquired by a single sensor. The technique exploits the unique relationship between multiple physiologic (source) and electronic (artifact) components in surface recorded sensory nerve action potential (SNAP) waveforms that are evoked by different activating magnitudes. A forward model of the SNAP is developed and used to test the approach on a simplified data simulation. The method is applied to experimental data and shown to be effective at separating artifact and source components and reconstructing artifact-free traces. A method of automated reconstruction for use within an expert system is also disclosed.
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Hindenburg Max F.
NeuroMetrix, Inc.
Pandiscio & Pandiscio
Szmal Brian
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