Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2010-11-15
2011-10-18
Nguyen, Hoai-An D (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S756050
Reexamination Certificate
active
08040140
ABSTRACT:
A method includes scanning a test socket after removal of a device under test to generate scan data. The scan data is compared to reference data. A presence of at least a portion of a pin in the test socket is identified based on the comparison. A test system includes a test socket, a scanner, and a control unit. The test socket is operable to receive devices under test. The scanner is operable to scan a test socket after removal of a device under test to generate scan data. The control unit is operable to compare the scan data to reference data and identify a presence of at least a portion of a pin in the test socket based on the comparison.
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Han Song
Kimbrough Douglas C.
Ryskoski Matthew S.
Wooten Christopher L.
GLOBALFOUNDRIES Inc.
Nguyen Hoai-An D
Williams Morgan & Amerson P.C.
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