Method and apparatus for identifying broken pins in a test...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Details

C324S756050

Reexamination Certificate

active

08040140

ABSTRACT:
A method includes scanning a test socket after removal of a device under test to generate scan data. The scan data is compared to reference data. A presence of at least a portion of a pin in the test socket is identified based on the comparison. A test system includes a test socket, a scanner, and a control unit. The test socket is operable to receive devices under test. The scanner is operable to scan a test socket after removal of a device under test to generate scan data. The control unit is operable to compare the scan data to reference data and identify a presence of at least a portion of a pin in the test socket based on the comparison.

REFERENCES:
patent: 4219053 (1980-08-01), Tyner et al.
patent: 5006842 (1991-04-01), Tobol
patent: 5073708 (1991-12-01), Matsumoto et al.
patent: 5233191 (1993-08-01), Noguchi et al.
patent: 6046803 (2000-04-01), Toh
patent: 6097202 (2000-08-01), Takahashi
patent: 6386237 (2002-05-01), Chevalier et al.
patent: 6445201 (2002-09-01), Simizu et al.
patent: 6477602 (2002-11-01), Loison
patent: 6565364 (2003-05-01), Yun
patent: 6746252 (2004-06-01), Scott
patent: 6824410 (2004-11-01), Co et al.
patent: 6961885 (2005-11-01), Man et al.
patent: 7123031 (2006-10-01), Twerdochlib
patent: 7471819 (2008-12-01), Ichikawa et al.
patent: 7701231 (2010-04-01), Yonushonis et al.
patent: 7791070 (2010-09-01), Huang et al.
patent: 2005/0210352 (2005-09-01), Ricchetti et al.
patent: 2006/0083419 (2006-04-01), Carbaugh et al.
patent: 2009/0127068 (2009-05-01), Ikeda et al.
patent: 2009/0136118 (2009-05-01), Ichikawa
patent: 1-229983 (1989-09-01), None
patent: 9-325172 (1997-12-01), None
patent: 2005-257428 (2005-09-01), None
patent: 10-2006-0078903 (2006-07-01), None
patent: WO2006109358 (2006-10-01), None
patent: WO2007017953 (2007-02-01), None
PCT Search Report from PCT/US2008/004961 dated Jul. 24, 2008.

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