Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2005-08-16
2008-10-28
Barlow, Jonh E. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
C702S057000, C702S179000, C702S191000, C714S025000, C714S048000, C714S699000, C708S827000, C327S307000, C330S009000, C331S017000, C324S601000
Reexamination Certificate
active
07444268
ABSTRACT:
One embodiment of the present invention provides a system that identifies a drift in a signal in a computer system. During operation, the system receives a sequence of quantized signal values of the signal. Next, the system generates a statistical distribution based on the sequence of quantized signal values, wherein the statistical distribution is generated using a set of counters, wherein each counter keeps track of the number of occurrences of an associated quantized signal value. The system periodically adjusts the counters by multiplying each counter by a compression factor if the system determines the sum of the set of counters is greater than or equal to a threshold. The system identifies the drift in the signal by comparing the statistical distribution with a reference distribution of the quantized signal values, wherein the reference distribution is associated with normal operation of the computer system.
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Kalamegham Praveen
Sportsman Nathan D.
Whisnant Keith A.
Barlow Jonh E.
Desta Elias
Park Vaughan & Fleming LLP
Sun Microsystems Inc.
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