Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1987-02-24
1988-10-25
Willis, Davis L.
Optics: measuring and testing
By particle light scattering
With photocell detection
350 9611, G01J 345
Patent
active
047799846
ABSTRACT:
An integrated optic holographic spectrometer (10) for analyzing electromagnetic radiation from a source (12) is disclosed. The holographic spectrometer (10) comprises a substrate (18) having aperture (20) for restricting the receipt of electromagnetic radiation. The spectrometer (10) also includes two optical waveguides (22, 24) for dividing the electromagnetic radiation received through the aperture (20) into at least a first and second portions. A geodesic lens (26) is provided for collimating the first and second portions of the electromagnetic radiation. Finally, the spectrometer (10) includes a linear detector array (28) optically communicating with the geodesic lens (26) to provide an output responsive to the interference between the first and second portions of the electromagnetic radiation received through the aperture (20).
REFERENCES:
patent: 4523846 (1985-06-01), Breckinridge et al.
patent: 4558951 (1985-12-01), Ludman et al.
Anderson, "Integrated Optical Spectrum Analyzer: An Imminent Chip", IEEE Spectrum, pp. 22-29, Dec. 1978.
Kawata, "Fourier Transform Spectrometer with a Self-Scanning Photodiode Array", Applied Optics vol. 23, No. 2 (1984).
Hughes Aircraft Company
Karambelas A. W.
Koren Matthew W.
Streeter W. J.
Taylor Ronald L.
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