Chemistry: analytical and immunological testing – Composition for standardization – calibration – simulation,... – Preparation composition
Reexamination Certificate
2008-06-24
2008-06-24
Soderquist, Arlen (Department: 1797)
Chemistry: analytical and immunological testing
Composition for standardization, calibration, simulation,...
Preparation composition
C422S062000, C422S129000, C422S130000, C422S131000, C436S085000, C436S139000, C436S155000, C436S159000, C436S161000, C436S164000, C436S172000, C436S183000
Reexamination Certificate
active
07390664
ABSTRACT:
The present invention relates to an apparatus and a process for the high-throughput, quick screening, optimization, regeneration, reduction and activation of catalysts. More specifically, the present invention is a method and apparatus to quickly screen, optimize and regenerate multiple fast deactivating catalysts while maintaining a predefined range of time-on-stream.
REFERENCES:
patent: 3206387 (1965-09-01), Smilski
patent: 3431077 (1969-03-01), Danforth
patent: 3485771 (1969-12-01), Horvath
patent: 4099923 (1978-07-01), Milberger
patent: 5519149 (1996-05-01), Contractor et al.
patent: 5959297 (1999-09-01), Weinberg et al.
patent: 6030917 (2000-02-01), Weinberg et al.
patent: 1273919 (2003-01-01), None
patent: WO 98/15969 (1997-10-01), None
patent: WO 00/29844 (2000-05-01), None
patent: WO 00/65326 (2000-11-01), None
patent: WO 01/59463 (2001-08-01), None
Creer, J. G. et al, Applied Catalysis 1986, 22, 85-95.
Hogan, R. J. et al, Preprints—American Chemical Society, Division of Petroleum Chemistry 1971, 16, D35-D42.
Johnston, H. D. et al, Preprints—American Chemical Society, Division of Petroleum Chemistry 1983, 28, 960-972.
Korf, C. J. et al, CSIR Report CENG 1986, 584, 31 pages.
Nakazaki, Y. et al, Industrial & Engineering Chemistry Research 1989, 28, 1285-1289.
Smeds, S. et al, Applied Catalysis A: General 1995, 125, 271-291.
Xiao, X. et al, Applied Catalysis A: General 1999, 183, 209-219.
Smeds, S. et al, Applied Catalysis A: General 1999, 185, 131-136.
Sarup, B. et al, Canadian Journal of Chemical Engineering 1984, 62, 249-256.
Haas, J. et al, Acta Physica et Chemica 1985, 31, 659-669.
Hutchings, G. J. et al, Applied Catalysis 1988, 43, 133-140.
Schulz, H. et al, Studies in Surface Science and Catalysis 1991, 61, 313-323.
Blasco, V. et al, AlChE Journal 1992, 38, 237-243.
Centi, G. e4t al, Industrial & Engineering Chemistry Research 1992, 31, 1947-1955.
Resasco, D. E. et al, Journal of Catalysis 1994, 146, 40-55.
Gayubo, A. G. et al, AlChE Journal 1997, 43, 1551-1558.
Magagula, Z. et al, Catalysis Today 1999, 49, 155-160.
Luo, M. et al, Studies in Surface Science and Catalysis 2001, 139, 133-140.
Toukoniitty, E. et al, Catalysis Today 2000, 60, 175-184.
Lee, S. H. et al, Applied Catalysis A: General 2002, 237, 91-101.
Dr. Manfred Baerns, “Parallelisierte Synthese and Schnelle Katalytische Testung von Katalysator-Bibliotheken fur Oxidationsreaktionen”,Chemie Ingenieur Technik(71), No. 8, Aug. 1999, pp. 873-877.
M. Orschel, “Detection of Reaction Selectivity on Catalyst Libraries by Spatially Resolved Mass Spectrometry”, Angew.Chem. Int. Ed., 1999, 38, No. 18, pp. 2791-2794.
P. Cong et al., “High-Throughput Synthesis and Screening of Combinatorial Heterogeneous Catalyst Libraries”, Angew. Chem. Int. Ed., 1999, 38, No. 4, pp. 484-488.
S. Senkan et al., “High-Throughput Testing of Heterogeneous Catalyst Libraries Using Array Microreactors and Mass Spectrometry”, Agnew. Chem. Int. Ed., 1999, 38, No. 18, pp. 1794-2799.
Fung Shun Chong
Ho Teh Chung
ExxonMobil Research and Engineering Company
Migliorini Robert A.
Soderquist Arlen
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