Method and apparatus for high precision weighted random pattern

Excavating

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

364717, G01R 3128

Patent

active

050439880

ABSTRACT:
A high precision weighted random pattern generation system generates any desired probability of individual bits within a weighted random bit pattern. The system includes a circular memory having a series of weighting factors stored therein, with each weighting factor representing the desired probability of a bit in the weighted random pattern being binary ONE. The random bits from a random number generator and a weighting factor are combined to form a single weighted random bit. The random bits and weighting factor are combined in a series of interconnected multiplexor gates. Each multiplexor gate has two data inputs, one being a bit from the weighting factor, the other being the output of the preceding multiplexor gate. The random number bit controls the output of the multiplexor. For example, when the control input (random bit) is high, the multiplexor output is the weighting factor bit. When the control input (random bit) is low, the multiplexor output is the output of the preceding multiplexor. The output of the final multiplexor gate in the series is the weighted bit.

REFERENCES:
patent: 3633100 (1972-01-01), Hellwell et al.
patent: 3636443 (1972-01-01), Singh et al.
patent: 3719885 (1973-03-01), Carpenter et al.
patent: 4546473 (1985-10-01), Eichelberger et al.
patent: 4687988 (1987-08-01), Eichelberger et al.
patent: 4688223 (1987-08-01), Motika et al.
patent: 4730319 (1988-03-01), David et al.
patent: 4745355 (1988-05-01), Eichelberger et al.
patent: 4754215 (1988-06-01), Kawai
patent: 4782288 (1988-11-01), Vento
patent: 4801870 (1989-01-01), Eichelberger et al.
patent: 4807229 (1989-02-01), Tada
patent: 4817093 (1989-03-01), Jacobs et al.
Gloster, Clay S. and Brglez, Franc, "Boundary Scan with Built-In Self-Test", IEEE Design & Test of Computers, Feb. 1989, pp. 36-44.
Lisanke et al., "Testability-Driven Random Test-Pattern Generation", IEEE Transactions on Computer-Aided Design, Nov. 1987, pp. 1082-1087.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for high precision weighted random pattern does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for high precision weighted random pattern , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for high precision weighted random pattern will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1420360

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.