Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With coupling means
Reexamination Certificate
2008-05-15
2010-06-01
Tang, Minh N (Department: 2829)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With coupling means
C324S11700H, C324S096000, C324S127000
Reexamination Certificate
active
07728578
ABSTRACT:
In order to extend the measurement range of a current sensor, a current divider is formed by a first conductor formed in a current sensor that is mounted on a printed circuit board and a second conductor on the printed circuit board that electrically shorts at least one input terminal of the current sensor to at least one output terminal of the current sensor. The input terminal of the current sensor supplies the current to be measured to the first conductor and the output terminal supplies the measured current back to the printed circuit board.
REFERENCES:
patent: 4176374 (1979-11-01), Eames
patent: 4240059 (1980-12-01), Wolf et al.
patent: 4536706 (1985-08-01), Kemper
patent: 4691338 (1987-09-01), Makino
patent: 4926116 (1990-05-01), Talisa
patent: 4931725 (1990-06-01), Hutt et al.
patent: 4939541 (1990-07-01), Sugiura
patent: 5015945 (1991-05-01), Radun
patent: 5032785 (1991-07-01), Mathis et al.
patent: 5070317 (1991-12-01), Bhagat
patent: 5124648 (1992-06-01), Webb et al.
patent: 5128611 (1992-07-01), Konrad
patent: 5478773 (1995-12-01), Dow et al.
patent: 5696441 (1997-12-01), Mak et al.
patent: 5717327 (1998-02-01), Bradford
patent: 5815391 (1998-09-01), Pelly
patent: 5952704 (1999-09-01), Yu et al.
patent: 5963038 (1999-10-01), De Jong et al.
patent: 5986341 (1999-11-01), Usami et al.
patent: 6054329 (2000-04-01), Burghartz et al.
patent: 6061224 (2000-05-01), Allen
patent: 6069397 (2000-05-01), Cornett et al.
patent: 6097203 (2000-08-01), Parker et al.
patent: 6169680 (2001-01-01), Matsui et al.
patent: 6271655 (2001-08-01), Weber et al.
patent: 6274920 (2001-08-01), Park et al.
patent: 6291872 (2001-09-01), Wang et al.
patent: 6356068 (2002-03-01), Steiner et al.
patent: 6384478 (2002-05-01), Pour
patent: 6414475 (2002-07-01), Dames et al.
patent: 6577115 (2003-06-01), Carpenter
patent: 6608361 (2003-08-01), Chang et al.
patent: 6661231 (2003-12-01), Arai et al.
patent: 6781359 (2004-08-01), Stauth et al.
patent: 6791341 (2004-09-01), Shenai et al.
patent: 6828770 (2004-12-01), McCauley et al.
patent: 6835576 (2004-12-01), Matsuzaki et al.
patent: 6894478 (2005-05-01), Fenske
patent: 6964918 (2005-11-01), Fan et al.
patent: 6972658 (2005-12-01), Findley et al.
patent: 6987307 (2006-01-01), White et al.
patent: 7118925 (2006-10-01), Brennan et al.
patent: 7196397 (2007-03-01), Chiola et al.
patent: 7203047 (2007-04-01), Holce et al.
patent: 7227240 (2007-06-01), Knapp et al.
patent: 7239123 (2007-07-01), Rannow et al.
patent: 7268409 (2007-09-01), Tseng et al.
patent: 7292400 (2007-11-01), Bishop
patent: 7362086 (2008-04-01), Dupuis et al.
patent: 7397234 (2008-07-01), Alfano et al.
patent: 7400025 (2008-07-01), Pitts et al.
patent: 7453142 (2008-11-01), Lee et al.
patent: 2002/0105080 (2002-08-01), Speakman
patent: 2003/0098505 (2003-05-01), Kimura et al.
patent: 2004/0021218 (2004-02-01), Hayama et al.
patent: 2004/0263148 (2004-12-01), Takabatake
patent: 2005/0003562 (2005-01-01), Bhatt et al.
patent: 2005/0007296 (2005-01-01), Endo et al.
patent: 2005/0103112 (2005-05-01), Pedersen et al.
patent: 2005/0134254 (2005-06-01), Roden et al.
patent: 2005/0156587 (2005-07-01), Yakymyshyn et al.
patent: 2005/0285262 (2005-12-01), Knapp et al.
patent: 2006/0020371 (2006-01-01), Ham et al.
patent: 2006/0038552 (2006-02-01), Omura et al.
patent: 2006/0044088 (2006-03-01), Vaitkus et al.
patent: 2006/0152323 (2006-07-01), Pavier
patent: 2006/0181385 (2006-08-01), Hurley
patent: 2007/0018298 (2007-01-01), Gamand
patent: 2007/0072340 (2007-03-01), Sanzo et al.
patent: 2007/0114651 (2007-05-01), Marimuthu et al.
patent: 2007/0139032 (2007-06-01), Dupuis et al.
patent: 2007/0139066 (2007-06-01), Dupuis et al.
patent: 2007/0139835 (2007-06-01), Alfano et al.
patent: 2008/0136399 (2008-06-01), Alfano et al.
patent: 2008/0157272 (2008-07-01), Tanaka
patent: 2009/0001962 (2009-01-01), Dupuis et al.
patent: 1498916 (2005-01-01), None
patent: 02082109 (2002-10-01), None
“Magnetic Current Sensing,” AN-209, Honeywell Solid State Electronics Center, Apr. 2000, 7 pages.
ACS704 Data Sheet, Allegro MicroSystems, Inc., (date prior to Oct. 9, 2005 email listing reference) 2 pages.
ACS704ELC-015 Data Sheet, Allegro MicroSystems, Inc. Rev. 6, 2005, 19 pages.
Honeywell, “Battery Powered Current Sensor” Ask the Engineer, Honeywell Solid State Electronics Center, 2003, 1 page.
Friedrich, Andreas P., and Lemme, Helmuth, “The Universal Current Sensor,” Sensors magazine, May 1, 2000, 12 pages.
Jalebi, Ehsan Abdi et al., Real Time Rotor Bar Current Measurements Using a Rogowski Coil Transmitted Using Wireless Technology, University of Cambridge White Paper, Aug. 9, 2003, 9 pages.
Jingsheng, Liao et al., “Studies of Rogowski Coil Current Transducer for Low Amplitude Current (100A) Measurement,” IEEE CCECE 2003 Canadian Conference on Electrical and Computer Engineering, vol. 1, May 4-7, 2003, 5 pages.
Koon, William, “Current Sensing for Energy Metering,” in Conference Proceedings IIC-China/ESC-China 2002, pp. 321-324.
Ward, D. A. and Exon, J. La T., “Using Rogowski Coils for Transient Current Measurements,” Engineering Science and Education Journal, Jun. 1993, 9 pages.
Honeywell, “1- and 2-Axis Magnetic Sensors HMC1001/1002, HMC1021/1022,” Honeywell Sensor Products Data Sheet, Rev. B, Apr. 2000, 17 pages.
Nakura, Toru, et al., University of Tokyo, Tokyo, Japan, “On-chip dl/dt Detector IP for Power Supply”; D & R Headline News, 2003, www.design-reuse.com, pp. 1-9.
Alfano Donald E.
Coffey Donald K.
Dupuis Timothy J.
Etter Brett E.
Silicon Laboratories Inc.
Tang Minh N
Zagorin O'Brien Graham LLP
LandOfFree
Method and apparatus for high current measurement does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for high current measurement, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for high current measurement will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4193353