Method and apparatus for handling a packaged integrated circuit

Details Method and apparatus for handling a packaged integrated circuit Method and apparatus for handling a packaged integrated circuit

1995-06-07

1997-03-25

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

G01R 3102

Patent

active

056148356

ABSTRACT:
A carrier is used to couple a packaged device having leads of a certain length to a testing device. The carrier includes an adapter for receiving packaged dies with leads that are cut so that they are otherwise too short for the testing device. The adapter thus allows the leads to be cut prior to testing.

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patent: 5038101 (1991-08-01), Murphy
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