Measuring and testing – Instrument proving or calibrating
Patent
1999-04-28
2000-02-15
Raevis, Robert
Measuring and testing
Instrument proving or calibrating
G01C 1738
Patent
active
060239603
ABSTRACT:
A high performance method and apparatus for testing a closed loop transducer is disclosed. A test bitstream signal is combined with a .SIGMA..DELTA. feedback bitstream of the transducer to produce a combined bitstream which is converted to a physical feedback to the sensor of the transducer. The .SIGMA..DELTA. bitstream output of the transducer is recorded for later analysis so as to test characteristics of the transducer. The test bitstream signal is preferably an oversampled, pulse density modulated signal. A testing arrangement is provided which is based upon the storage of short-length test patterns which are repetitively accessed to form a continuous test pattern. The test bitstream provided by the method of the invention produces very low noise and low distortion test signals where a repetitive test pattern is equivalent in length to one period of the test signal.
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Abrams Michael L.
Dupuie Scott T.
Gannon Jeffery C.
Johnson Richard A.
Jones Ben W.
Bush Gary L.
I/O Sensors, Inc.
Raevis Robert
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