Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
Patent
1992-11-16
1994-03-08
Sikes, William L.
Electrical transmission or interconnection systems
Nonlinear reactor systems
Parametrons
307269, 328 63, 328 72, H03K 400, H03K 513, H03K 700, H03K 1700
Patent
active
052930807
ABSTRACT:
A test waveform generator comprises a storage unit (1a , 1b) for storing timing information; a timing generator unit (2a, 2b) to which the timing information is input from the storage unit and which is adapted to output a timing pulse at a predetermined time on the basis of the timing information; and a waveform generating unit (3, 4) to which the pulse from the timing generator unit is input and which is adapted to output a test waveform. The timing generator unit is arranged so that the timing of the timing pulse is set with either (1) a period clock signal (CLK) serving as a reference or (2) another timing pulse serving as a reference.
REFERENCES:
patent: 4460999 (1984-07-01), Schmidt
patent: 4639919 (1987-01-01), Chang et al.
patent: 4998025 (1991-03-01), watanabe
James T. Healy, "Automatic Testing and Evaluation of Digital Integrated Circuits," Reston Publishing Co., Inc., Chapter 3, pp. 18-31.
Anthony K. Stevens, "Introduction to Component Testing," Addison-Wesley's Series on Applied Computer Engineering Topics, Chapter 2.3, pp. 21-25.
Hiwada Kiyoyasu
Kasuga Nobuyuki
Hewlett--Packard Company
Phan Trong
Sikes William L.
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