Method and apparatus for generating run time profiles for...

Data processing: software development – installation – and managem – Software program development tool – Testing or debugging

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C717S134000, C717S135000, C717S140000, C717S158000

Reexamination Certificate

active

07975263

ABSTRACT:
A method for managing a profile includes generating an initial profile of code using an initial sampling frequency. An information entropy value of the profile is computed. A representative profile of the code is determined from additional profiles using a sampling frequency determined from the information entropy value. Other embodiments are disclosed and claimed.

REFERENCES:
patent: 4937765 (1990-06-01), Shupe et al.
patent: 5717393 (1998-02-01), Nakano et al.
patent: 5796939 (1998-08-01), Berc et al.
patent: 5815720 (1998-09-01), Buzbee
patent: 6070009 (2000-05-01), Dean et al.
patent: 6163840 (2000-12-01), Chrysos et al.
patent: 6195748 (2001-02-01), Chrysos et al.
patent: 6202205 (2001-03-01), Saboff et al.
patent: 6631518 (2003-10-01), Bortnikov et al.
patent: 6760907 (2004-07-01), Shaylor
patent: 7587709 (2009-09-01), Chilimbi et al.
patent: 7739662 (2010-06-01), Bouguet et al.
patent: 7747988 (2010-06-01), Zhu et al.
patent: 2002/0099714 (2002-07-01), Murray
patent: 2004/0010785 (2004-01-01), Chauvel et al.
patent: 2004/0216082 (2004-10-01), Sun
patent: 2005/0251325 (2005-11-01), Kudo et al.
McEliece, The Theory of Information and Coding, Cambridge University Press, 2004, p. 17.
Carter, An Introduction to Information Theory and Entropy, Complex Systems Summer School, California State University Stanislaus, Jun. 2003, pp. 1-126, accessed Mar. 4, 2010 <http://astarte.csustan.edu/˜tom/SFI-CSSS/2003/info-lec.pdf>.
Das et al., Performance of Runtime Optimization on BLAST, Computer Science and Engineering Technical Report 04-038, University of Minnesota, Oct. 15, 2004, pp. 1-25, accessed Mar. 4, 2010 <http://www.cs.umn.edu/tech—reports—upload/tr2004/04-038.pdf>.
Li et al., Entropy-Based Criterion in Categorical Clustering, Proceedings of the 21st International Conference on Machine Learning, Jul. 2004, pp. 68-75, accessed Mar. 9, 2010 <http://doi.acm.org/10.1145/1015330.1015404>.
Zhang et al., System Support for Automatic Profiling and Optimization, SIGOPS Operating Systems Review, Dec. 1997, pp. 15-26, accessed Mar. 3, 2010 <http://doi.acm.org/10.1145/269005.266640>.
“Estimation of rare event probabilities using cross-entropy”, Homem-de-mello et al., Dec. 2002, pp. 310-319, <http://delivery.acm.org/10.1145/1040000/1030499/p310-homem-de-mello.pdf>.
“Using perfect sampling in parameter estimation of a whole sentence maximum entropy language model”, Amaya et al., Sep. 2000, pp. 79-82, <http://delivery.acm.org/10.1145/1120000/1117618/p79-amaya.pdf>.
“Entropy-Based Profile Characterization and Classification for Automatic Profile Management”, Kim et al., 2007, pp. 40-51, <http://dynopt.dtc.umn.edu/papers/kim-acsac-2007.pdf>.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for generating run time profiles for... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for generating run time profiles for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for generating run time profiles for... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2738852

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.