Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1992-06-19
1994-07-05
Turner, Samuel A.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356345, G01B 902
Patent
active
053272234
ABSTRACT:
A microscope interferometer is described, that scans an object surface through a membrane mask with a multitude of pinholes. Light reflected back through the pinholes interferes with the darkfield image of the mask surface. The mask to object separation can be stabilized by an air flow through the pinholes. Image processing techniques allow to overcome the Abbe diffraction limit for the lateral resolution.
International Business Machines - Corporation
Kim Robert
Leas James M.
Thornton Francis J.
Turner Samuel A.
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