Method and apparatus for generating and transferring high speed

Optical: systems and elements – Deflection using a moving element – Using a periodically moving element

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371 27, 356388, 324158R, H04J 1408, G01R 3128

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active

051776308

ABSTRACT:
An optical architecture is provided that can be used for generating high-speed input test vectors from low speed digital data and transferrring those test vectors to a device under test. The optical architecture employs gain-switched laser diodes or optical mixers to produce high-speed optical pulses from the low speed digital data. Optical multiplexing and variable delay devices process the high speed optical pulses to form a high-speed test vector. The architecture can generate test data with psec-type accuracy.

REFERENCES:
patent: 4267590 (1981-05-01), Bosotti
patent: 4467468 (1984-08-01), Miller
patent: 4800265 (1989-01-01), Marzari
patent: 4908762 (1990-03-01), Suzuki et al.
patent: 5013907 (1991-05-01), Bateman
patent: 5028131 (1991-07-01), Dunsmore
John AuYeung, Appl. Phys. Lett. 38, 308-310 (1981).
A. Takada, M. Saruwatari, Electron Lett. 24, 1406-1408 (1988).
R. Wallace, "Air Force Seeking VHSIC Testers Replacement for GR18 Tester", Electronic Engineering Times, Sep. 1987, p. 1.
"Pattern Generator Stimulates 20Gb/s GaAs and ECL ICs"Microwaves & RF, Aug. 1989, p. 169.
"How Genrad's New Tester Copes with VHSIC Chips", Electronics, May 19, 1986, pp. 49-52.
T. R. Gheewala, "Requirements and Interim Solutions For High-Speed Testing of GaAs ICs", CH 2182-4/85/000-0143, GaAs IC Symposium, 1985, pp. 143-146.
J. McLeod, "Can Testers Catch Up With Complex Chips"Electronics, Jan. 22, 1987, pp. 49-52.
B. Milne, "ASIC Verification Systems Flight To Measure Up", Electronic Design, Sep. 8, 1988, pp. 63-70.
W. Davenport, P. J. Hamilton, L. Penque, D. Perkins, "A GaAs Gate Array Layout Tests ASIC Chips Up to 800 Mhz", Electronic Design, Jan. 21, 1988 pp. 93-95.
D. J. Fouts, J. M. Johnson, S. E. Butner, S. I. Long, "System Architecture Of A Gallium Arsenide One-Gigahertz Digital IC Tester", Computer, May, 1987, pp. 58-70.
J. McLeod, "ASIC Verification: Chasing A Moving Target", Electronics, Nov. 28, 1987, pp. 79-85.
B. Milne, "HP Claims Its IC Tester Runs Faster Than Any Other", Electronics, Dec. 18, 1986, p. 129.
B. Harvey, "Prototype Verifier Sets Its Sights On The Latest VHSIC Devices", Electronic Design, Nov. 27, 1987, pp. 49-52.
"Tektronix Testers Toil at 200 MHz".
"Dataprobe Creator Builds 1.2 GHz Test System".
B. Harvey, "Build A Circuit-Board Tester With Your PC", Electronic Design, Feb. 9, 1989, pp. 81-84.
M. A. Fischetti, "Whatever Happened to SOS ICs", IEEE Spectrum, Mar. 1986, p. 24.
I. Stumbler, "Program Will Improve Methods of Manufacture For VHSIC Devices".
W. M. Ribble, "Choosing An IC Tester", Electronics Week, Mar. 25, 1985, pp. 61-64.
K. Habara, K. Kikuchi, "Pulse Code Modulation of a Gain-Switched LD and its Application to a High-Speed Electrooptical Time Multiplexer", Journal of Lightwave Technology, vol. LT-5, No. 10, Oct. 1987.

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