Image analysis – Histogram processing – For setting a threshold
Patent
1985-09-04
1986-08-26
Boudreau, Leo H.
Image analysis
Histogram processing
For setting a threshold
382 25, 250223B, G06K 900
Patent
active
046087095
ABSTRACT:
A method and apparatus for measuring the outer diameters, ovality and eccentricity of the finish of a container is disclosed. The invention can be practiced in either a one-camera or a two-camera embodiment. The one-camera embodiment comprises means for illuminating the finish with a collimated beam of light to produce a transmitted beam containing a shadow of the finish and means for focusing the transmitted beam containing the shadow of the finish to produce the image thereof. The apparatus further comprises a line-scan camera for periodically scanning sequential segments of the image from one periphery to the other periphery as the container rotates for providing a plurality of pixel signals for each scan, and a data circuit responsive to the magnitudes of the pixel signals in each of the scans for counting the number of signals in the peripheries of the image to provide a left periphery count and a right periphery count for each scan. The apparatus further comprises a computer responsive to the periphery counts for calculating the outer diameter of the finish and for providing a reject signal if the outer diameter is not between a predetermined maximum and minimum value.
REFERENCES:
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patent: 4500203 (1985-02-01), Bieringer
Dunlap John H.
Hedler Robert C.
Kohler Robert D.
Boudreau Leo H.
Nelson John R.
Owens--Illinois, Inc.
Todd Jacqueline
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