Method and apparatus for gas concentration quantitative...

Details Method and apparatus for gas concentration quantitative... Method and apparatus for gas concentration quantitative...

2008-03-18

2010-12-07

Chowdhury, Tarifur (Department: 2886)

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrophotometer

C356S451000, C250S339070

Reexamination Certificate

active

07847935

ABSTRACT:
An FTIR measurement is conducted on a background gas to obtain a single beam spectrum SB(BG) [C] and a synthetic single beam spectrum SSB(BG)[D], and an FTIR measurement is conducted on a sample gas to obtain a single beam spectrum SB(Samp)[E] and a synthetic single beam spectrum SSB(Samp)[F]. A double synthetic absorbance spectrum DSAbs of the sample gas as expressed by the following formula (Step T9) is calculated to obtain a concentration of a trace component (impurity) contained in the sample gas:in-line-formulae description="In-line Formulae" end="lead"?DSAbs =−log[SB(Samp) SSB(BG)/SSB(Samp) SB(BG)]in-line-formulae description="In-line Formulae" end="tail"?

REFERENCES:
patent: 2004/0211900 (2004-10-01), Johnson
patent: 2002-22536 (2002-01-01), None

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