Method and apparatus for forming refractory metal films

Coating processes – Coating by vapor – gas – or smoke – Metal coating

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427255, 4272551, 4273831, 427124, 427 99, C23C 1606, C23C 1656

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active

052119874

ABSTRACT:
A method for improving the adhesion between a refractory metal film and a silicon substrate is disclosed, which comprises depositing the refractory metal film on the silicon substrate at a first temperature; and heating the contact surface between the deposited film and the silicon surface at a second temperature between 300.degree. and 600.degree. C., wherein the depositing and heating steps are performed in a single reaction furnace and the temperature between the depositing and heating steps does not drop below about 300.degree. C.

REFERENCES:
patent: 4619840 (1986-10-01), Goldman et al.
patent: 4794019 (1988-12-01), Miller
patent: 4988670 (1991-01-01), Itozaki et al.
Ohba et al., "Selective CVD Tungsten Silicide for VLSI Applications," IEDM 1987, Extended Abstract pp. 213-216.
Kotani et al., "A Highly Reliable Selective CVD-W Utilizing SiH.sub.4 Reduction for VLSI Contacts," IEDM 1987, Extended Abstract, pp. 217-220.
Green et al., "Structure of Selective Low Pressure Chemically Vapor-Deposited Films of Tungsten," J. Electrochem. Soc., vol., 132, No. 5, 1985, pp. 1243-1250.
Michael Diem, Michael Fisk and Jon Goldman, "Properties of Chemically Vapor-Deposited Tungsten Thin Films on Silicon Wafers", Thin Solid Films, 107 (1983) 39-43, Electronics and Optics.

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