Method and apparatus for forming contact hole

Semiconductor device manufacturing: process – Chemical etching – Liquid phase etching

Reexamination Certificate

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C216S017000, C438S689000

Reexamination Certificate

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07618898

ABSTRACT:
A method of forming a contact hole in an insulating film coating amorphous Si having an irregular surface formed on an insulating substrate, for connecting the amorphous Si to a conductor film formed on the insulating film, including: etching the insulating film using reactive ion etching to a depth whereat said irregularity does not disappear; and sputter-etching the surface of the amorphous Si.

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patent: 2008/0283930 (2008-11-01), Dyer et al.
patent: 11-111988 (1999-04-01), None
patent: 2001-274411 (2001-10-01), None

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