Method and apparatus for flaw detection using an AC saturating f

Electricity: measuring and testing – Magnetic – With means to create magnetic field to test material

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324237, 324220, 324238, G01N 2790, G01N 2782

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active

054184592

ABSTRACT:
A method for nondestructive examination of an object of type having localized permeability variations therein and varying surface conditions and grain structures comprises the steps of AC flux saturating a localized surface area of the object so as to magnetically saturate the surface area to quiet localized permeability variations therein and to set up a stabilized high level primary field on the surface substantially unalterable by the varying surface conditions and grain structures in the object and detecting eddy currents in the surface area. Coil structure and apparatus for implementing the method are also defined. Further, the method is disclosed as being implemented in part by the use of components of a pre-existing object evaluation device.

REFERENCES:
patent: 3562635 (1971-02-01), Parker
patent: 3852663 (1974-12-01), Brooks et al.
patent: 3875502 (1975-04-01), Neumaier
patent: 3900783 (1975-08-01), Mansson
patent: 4188577 (1980-02-01), Mhatre et al.
patent: 4461995 (1984-07-01), Harris
patent: 4644272 (1987-02-01), Janos
patent: 4808926 (1989-02-01), Graham et al.
patent: 5117182 (1992-05-01), Cecco et al.
patent: 5311127 (1994-05-01), Bisiaux

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