Method and apparatus for fixtured wax and trace

Details Method and apparatus for fixtured wax and trace Method and apparatus for fixtured wax and trace

2006-02-14

2006-02-14

Larkin, Daniel S. (Department: 2856)

Measuring and testing

Surface and cutting edge testing

C073S105000, C033S551000, C033S561200

Reexamination Certificate

active

06997046

ABSTRACT:
A method and apparatus is provided for making impressions of edges and profiling the edges using a profiling machine. The apparatus allows the impressionable material used for forming the impression to be held in a fixed position while the impression of the edge is formed, and then allows the impression to be withdrawn in a manner that leaves the impression substantially unchanged and substantially true to the profile of the edge. The apparatus also comprises fittings to make the apparatus compatible with a profiling machine and allows the impression to be positioned in the profiling machine in substantially the same orientation every time an impression is taken.

REFERENCES:
patent: 2601703 (1952-07-01), Sawyer
patent: 4043187 (1977-08-01), Tomomatsu
patent: 4255862 (1981-03-01), Nakamura
patent: 4618465 (1986-10-01), Parks
patent: 4951497 (1990-08-01), Gilibert
patent: 5090811 (1992-02-01), Donaldson
patent: 5344302 (1994-09-01), Beehler et al.
patent: 5500737 (1996-03-01), Donaldson et al.
patent: 5546797 (1996-08-01), Dutta et al.
patent: 5642293 (1997-06-01), Manthey et al.
patent: 5684573 (1997-11-01), Khazaka et al.
patent: 6019669 (2000-02-01), Kitao et al.
patent: 6090027 (2000-07-01), Brinkman
patent: 6110401 (2000-08-01), Lee et al.
patent: 6175415 (2001-01-01), Pietrzak et al.
patent: 6205240 (2001-03-01), Pietrzak et al.
patent: 6314798 (2001-11-01), Nomura et al.

Affiliated with

Also associated with

Rating

Method and apparatus for fixtured wax and trace does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for fixtured wax and trace, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for fixtured wax and trace will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3707966