Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2006-01-10
2009-10-13
Chang, Jon (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S152000, C382S154000
Reexamination Certificate
active
07602963
ABSTRACT:
A method for non-destructive examination of parts includes producing a 3-D image of a sample of a part, extracting a point cloud of the image of the sample of the part, and registering the point cloud to a CAD coordinate system. The method further includes determining points in the point cloud of the image that are more than a specified distance from surfaces on a CAD 3-D model of the part using the same coordinate system, and utilizing the determined points to determine the presence of anomalies or present an image of anomalies in the sample of the part.
REFERENCES:
patent: 5111048 (1992-05-01), Devitt et al.
patent: 5345514 (1994-09-01), Mahdavieh et al.
patent: 5848115 (1998-12-01), Little et al.
patent: 6041132 (2000-03-01), Isaacs et al.
patent: 6285449 (2001-09-01), Ellingson et al.
patent: 6683641 (2004-01-01), MacCracken et al.
patent: 6968730 (2005-11-01), Schafrik et al.
patent: 7095221 (2006-08-01), Bosselmann et al.
patent: 7149339 (2006-12-01), Veneruso
patent: 2003/0135846 (2003-07-01), Jayaram et al.
patent: 2004/0254758 (2004-12-01), Chang
patent: 0875751 (1998-04-01), None
Obrist, Flisch, Hofmann, “Point Cloud Reconstruction with Sub-Pixel Accuracy by Slice-Adaptive Thresholding of X-Ray Computed Tomography images,” NDT & E International, Butterworth-Heinemann, Oxford, GB, vol. 37(5):375-380 (Jul. 5, 2004).
Partial European Search Report, App. No. EP 07 10 0324, (Apr. 24, 2007).
Sulzmann, et al., “Augmented Reality as an Interactive Tool for Microscopic Imaging, Measurement and Model Based Verification of Simulated Parts,” Retrieved from the Internet: URL: http://www.nsti.org/publ/MSM98/W1402.pdf>, pp. 194-198 (1998).
Christian Schutz, Geometric point matching of free-form 3D objects, Retrieved from the Internet: URL: http://www-imt.unine.ch/parlab/pub/the sis/csthesis/theseSchutz.pdf>, pp. 1-147 (1998).
Prieto, et al., “An Automated Inspection System,” Abstract Only. The Int'l J of Advanced Mfg Tech 19:12 (Jun. 2002) Retrieved on-line (http://www.springerlink.com/content) on May 17, 2007.
Gomercic, et al., “Robot-based 3D imaging in industrial inspection.” Abstract Only. Industrial Informatics, 2004. Retrieved on-line (http://ieeexplore.ieee.org/xpl/absprintf.jsp) on May 17, 2007.
Hofmann, et al., “Adaptive CT scanning—mesh based optimisation methods for industrial x-ray computed tomography applications.” Abstract Only. NDT&E International 37(2004):271-278. Retrieved on-line (http://www.empa.ch/plugin/bean/empa) on May 17, 2007.
Yancey, et al., “CT-assisted metrology for manufacturing applications.” Abstract Only. Proceedings of SPIE—vol. 2948 pp. 222-231 (Nov. 1996). Retrieved on-line (http://spiedigitallibrary.aip.org/vsearch/servlet) on May 17, 2007.
Bauer, et al., “Computer tomography for nondestructive testing in the automotive industry,” Abstract Only. Proceedings of SPIE—vol. 5535, pp. 464-472 (Oct. 2004). Retrieved on-line (http://spiedigitallibrary.aip.org/vsearch) on May 17, 2007.
European Search Report, App. No. EP 07 10 0324, (Jul. 25, 2007).
Sulzmann, et al., “Augmented Reality as an Interactive Tool for Microscopic Imaging, Measurement and Model Based Verification of Simulated Parts,” Retrieved from the Internet: URL: http://www.nsti.org/publ/MSM98/W1402.pdf>, pp. 194-198 (1998) (Previously submitted on Jun. 11, 2007).
Christian Schutz, Geometric point matching of free-form 3D objects, Retrieved from the Internet: URL: http://www-imt.unine.ch/parlab/pub/the sis/csthesis/theseSchutz.pdf>, pp. 1-147 (1998)(Previously submitted on Jun. 11, 2007).
Prieto, et al., “An Automated Inspection System,” Abstract Only. The Int'l J of Advanced Mfg Tech 19:12 (Jun. 2002) Retrieved on-line (http://www.springerlink.com/content) on May 17, 2007.(Previously submitted on Jun. 11, 2007).
Gomercic, et al., “Robot-based 3D imaging in industrial inspection.” Abstract Only. Industrial Informatics, 2004. Retrieved on-line (http://ieeexplore.ieee.org/xpl/absprintf.jsp) on May 17, 2007 (Previously submitted on Jun. 11, 2007).
Yancey, et al., “CT-assisted metrology for manufacturing applications.” Abstract Only. Proceedings of SPIE—vol. 2948 pp. 222-231 (Nov. 1996). Retrieved on-line (http://spiedigitallibrary.aip.org/vsearch/servlet) on May 17, 2007 (Previously submitted on Jun. 11, 2007).
Bauer, et al., “Computer tomography for nondestructive testing in the automotive industry,” Abstract Only. Proceedings of SPIE—vol. 5535, pp. 464-472 (Oct. 2004). Retrieved on-line (http://spiedigitallibrary.aip.org/vsearch) on May 17, 2007. (Previously submitted on Jun. 11, 2007).
Stanley, et al., “Reverse Engineering and Rapid Prototyping for Solid Freeform Fabrication,” SPIE, vol. 2455, pp. 306-311 (1995).
Lee, et al., “Development of Metrological NDE Methods for Microturbine Ceramic Components,” 45th ASME Gas Turbine and Aeroengine Symposium [Online]. Retrieved on-line (http://www.ornl.gov/sci/de—materials/documents/ceramic—reliability/Lee—Devel—%20 Metro—NDE—Methods-ASME-2000.pdf>) (Jul. 24, 2007).
Flisch, et al., “Industrial Computed Tomography in Reverse Engineering Applications,” No. 8, pp. 45-53 XP002444033, Computerized Tomography for Industrial Applications and Image Processing in Radiology, Mar. 15-17, 1999, Berlin, Germany.
Obrist, et al., “Point Cloud Reconstruction with Sub-Pixel Accuracy by Slice-Adaptive Thresholding of X-Ray Computed Tomography Images,” NDT & E International, Butterworth-Heinemann, Oxford, GB, vol. 37(5):373-380 (Jul. 5, 2004).
Janning John C.
Little Francis Howard
Nightingale Gerald B.
Andes Esq. William Scott
Armstrong Teasdale LLP
Chang Jon
General Electric Company
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