Method and apparatus for finding and locating manufacturing defe

Details Method and apparatus for finding and locating manufacturing defe Method and apparatus for finding and locating manufacturing defe

1999-06-09

2000-11-07

Brown, Glenn W.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

324527, 324537, G01R 3108, G01R 31312

Patent

active

061442100

ABSTRACT:
A method and apparatus for detection of manufacturing defects during in-circuit testing. A preferred embodiment utilizes an onboard controllable signal source and/or an external signal source, in combination with capacitive sensors, to detect defects. In an embodiment of the present invention, prediction equations are implemented to increase both the efficiency and effectiveness of defect detection and location.

REFERENCES:
patent: 5124660 (1992-06-01), Cilingiroglu
patent: 5254953 (1993-10-01), Crook et al.
patent: 5256975 (1993-10-01), Mellitz et al.
patent: 5268645 (1993-12-01), Prokoff et al.
patent: 5363048 (1994-11-01), Modlin et al.

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