Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate
2005-03-15
2005-03-15
Le, N. (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
For fault location
C324S534000
Reexamination Certificate
active
06867597
ABSTRACT:
In the case of the present-day trend of miniaturizing housed electronic devices, there is the problem that the contact spacings between the terminal pins becomes smaller and smaller and are no longer visible optically. As a result, it also becomes more difficult to solder the contacts of correspondingly designed contact bases, which for example, are designed as test bases, to the individual conductor tracks of the printed circuit board. Possible faulty soldering points, short circuits or interruptions have hitherto been tracked down by laborious manual measurement using the TDR method. The invention proposes producing a test device in which in each case two terminal pins are connected to a short-circuiting bridge. The test device is inserted into the contact base and connects two signal paths of the printed circuit board on which the propagation time of a reflected wave can be measured.
REFERENCES:
patent: 5491427 (1996-02-01), Ueno et al.
patent: 5841296 (1998-11-01), Churcher et al.
patent: 5977773 (1999-11-01), Medelius et al.
patent: 6191601 (2001-02-01), Swart
patent: 6369601 (2002-04-01), Ishigaki
patent: 6512377 (2003-01-01), Deng et al.
patent: 6570397 (2003-05-01), Mayder et al.
patent: 6697766 (2004-02-01), Qian et al.
patent: 20030218463 (2003-11-01), Stierman et al.
patent: 199 23 384 (2000-11-01), None
Hauptner Lenart
Kilian Volker
Roth Richard
Sommer Stefan
Greenberg Laurence A.
Infineon - Technologies AG
Le N.
Locher Ralph E.
Natalini Jeff
LandOfFree
Method and apparatus for finding a fault in a signal path on... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for finding a fault in a signal path on..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for finding a fault in a signal path on... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3429013