Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent
1996-12-12
1998-05-05
Karlsen, Enrest F.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
324620, 324626, 324613, 364576, G01R 2320
Patent
active
057480010
ABSTRACT:
A method and apparatus for fast response and distortion measurement of a signal transfer device. A computer processor generates a multitone test signal of predetermined duration and stores it in a memory. The test signal is read out, converted to analog form, if necessary, and applied to the input of a device under test. The output produced by the device under test in response to the test signal is acquired and digitized, if necessary, and a Fast Fourier Transform is performed on the acquired data to determine its spectral characteristics. Frequency response, harmonic distortion, intermodulation distortion, phase distortion, wow and flutter and other signal transfer characteristics are measured by the CPU by analysis of the output signal.
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patent: 4774454 (1988-09-01), Yamaguchi
patent: 5420516 (1995-05-01), Cabot
patent: 5475315 (1995-12-01), Cabot
Audio Precision, Inc.
Karlsen Enrest F.
Solis Jose M.
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