Method and apparatus for extracting pattern contours in image pr

Image analysis – Histogram processing – For setting a threshold

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382 21, 382 19, 382 18, G06K 948

Patent

active

049088726

ABSTRACT:
This invention relates to a method and apparatus for extracting contour lines from a pattern obtained in image processing. The disclosed method and apparatus makes it possible to obtain the contour lines in real-time and, moreover, can be easily incorporated into hardware. To achieve these objects, a invention applies the simplified discrimination method for selecting pixels, which form the pattern contour, wherein each pixel is examined within groups of pixel, i.e. X-axis and Y-axis groups. The magnitude of a gray level gradient of each pixel is compared with those of neighboring pixels located in either direction of X-axis group or Y-axis. The pixel which has the maximum magnitude of gray level gradient among those of adjacent pixels is discriminated from each group as contour date. This discrimination method is simple and remarkably improved. When contour lines for two groups are combined, the pattern contours can be easily obtained.

REFERENCES:
patent: 4747150 (1988-05-01), Knutsson et al.
patent: 4747151 (1988-05-01), Knutsson et al.
patent: 4747152 (1988-05-01), Knutsson et al.

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