Data processing: database and file management or data structures – Database and file access – Record – file – and data search and comparisons
Reexamination Certificate
2007-12-21
2011-11-01
Leroux, Etienne (Department: 2161)
Data processing: database and file management or data structures
Database and file access
Record, file, and data search and comparisons
C707S765000, C717S173000
Reexamination Certificate
active
08051093
ABSTRACT:
A method includes defining a general query for extracting data from at least one data store operable to store workpiece data associated with the processing of workpieces in a manufacturing system. The general query specifies at least one ambiguous parameter having a plurality of potential values. Metadata associated with the workpiece data is accessed. The metadata is employed to identify a plurality of candidate values for the at least one ambiguous parameter. A plurality of atomic queries is generated. Each atomic query is associated with one of the candidate values. The plurality of atomic queries is executed to extract data from the at least one data store and generate an output report including the extracted data.
REFERENCES:
patent: 6904433 (2005-06-01), Kapitskaia et al.
patent: 2005/0004774 (2005-01-01), Volk et al.
patent: 2006/0010416 (2006-01-01), Keck et al.
patent: 2007/0118549 (2007-05-01), Bornhoevd et al.
Haskins Andrew P.
Kaupas George M.
Kunchala Sundeep
Advanced Micro Devices , Inc.
Leroux Etienne
Rahman Mohammad
Williams Morgan & Amerson P.C.
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