Method and apparatus for extending the lifetime of a...

Miscellaneous active electrical nonlinear devices – circuits – and – Specific identifiable device – circuit – or system – With specific source of supply or bias voltage

Reexamination Certificate

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Details

C327S530000, C327S540000, C323S313000

Reexamination Certificate

active

07821330

ABSTRACT:
A circuit and a method for extending the lifetime of a semiconductor chip. The circuit including a voltage reference generator, a voltage switch, a threshold voltage regulator device and a threshold voltage monitor device tunes an automatic internal power supply. The voltage reference generator provides one or more reference voltage levels that are transmitted to the voltage switch. The threshold voltage monitor device monitors the threshold voltage of the device, triggering the voltage switch to select a reference level for use as a voltage reference for the regulator when the threshold voltage of the monitored device exceeds a predetermined value. The regulator then converts the external power supply to an internal supply and holds it at the predetermined reference level.

REFERENCES:
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patent: 6396739 (2002-05-01), Briner
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patent: 6700363 (2004-03-01), Tachimori
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patent: 2005/0168271 (2005-08-01), Brox
patent: 2005/0280463 (2005-12-01), Chih
patent: 2006/0103451 (2006-05-01), Lim et al.
U.S. Appl. No. 11/832,796, Titled “Method And Apparatus To Measure Threshold Shifting Of A MOSFET Device And Voltage Difference Between Nodes” Hsu, et al. filed Aug. 2, 2007.

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