Method and apparatus for excess signal correction in an imager

Details Method and apparatus for excess signal correction in an imager Method and apparatus for excess signal correction in an imager

2009-11-16

2011-11-01

Ko, Tony (Department: 2878)

Radiant energy

Photocells; circuits and apparatus

Photocell controlled circuit

C250S370090, C250S370110

Reexamination Certificate

active

08049156

ABSTRACT:
A method and apparatus for excess signal compensation in an imaging system is described. In one particular embodiment, the invention provides for non-linear background, offset (due to time dependent dark current) and/or lag (including constant, linear and non-linear terms, due to image persistence) corrections of large area, flat panel imaging sensors.

REFERENCES:
patent: 5099505 (1992-03-01), Seppi et al.
patent: 5377654 (1995-01-01), LoRusso et al.
patent: 5452338 (1995-09-01), Granfors et al.
patent: 5692507 (1997-12-01), Seppi et al.
patent: 5774521 (1998-06-01), Close et al.
patent: 5878108 (1999-03-01), Baba et al.
patent: 6028913 (2000-02-01), Meulenbrugge
patent: 6067342 (2000-05-01), Gordon
patent: 6222901 (2001-04-01), Meulenbrugge et al.
patent: 6285799 (2001-09-01), Dance et al.
patent: 6345113 (2002-02-01), Crawford et al.
patent: 6353654 (2002-03-01), Granfors et al.
patent: 6421409 (2002-07-01), Paulus et al.
patent: 6842502 (2005-01-01), Jaffray et al.
patent: 6928182 (2005-08-01), Chui
patent: 6996288 (2006-02-01), Sun
patent: 7215732 (2007-05-01), Yin et al.
patent: 7376255 (2008-05-01), De Man et al.
patent: 7423253 (2008-09-01), Partain et al.
patent: 2001/0008271 (2001-07-01), Ikeda et al.
patent: 642264 (1995-03-01), None
Sussan Pourjavid et al. “Compensation for Image retention in an amorphous Silicon Detector”, SPIE Conference on Physics of Medical Imaging, Feb. 1999, vol. 3659, p. 501-509.
P.A. Iles and Y.C.M. Yeh, “Silicon, Gallium Arsenide, and Indium Phosphide Cells: Single Junction, One Sun Space”, Solar Cells and Their Applications, ISBN 0-471-57420-1, 1995, pp. 99-123.
A. Catalano, “a-Si:H-Based Solar Cells”, Solar Cells and Their Applications, ISBN 0-471-57420-1, 1995, pp. 163-184.
H.C. Slade et al. “Below Threshold Conduction in a-Si:H Thin Film Transistors With and Without a Silicon Nitride Passivating Layer”, Appln. Phys. Lett. 69(17), Oct. 21, 1996, pp. 2560-2562.
John A Rowlands, “Flat Panel Detectors for Digital Radiography”, “Handbook of Medical Imaging”, Jacob beutel et al. vol. 1, Physics and Psychophysics , 2000, SPIE The Society of Photo-Optical Instrumentation Engineers, pp. 223-328.
S.M.J.J.g. Nijsten, “A Global Calibration Model for a-Si EPIDs Used for Transit Dosimetry”, Med. Phys., Oct. 2007, vol. 34, pp. 3872-3884.
Aili K. Bloomquist, “Lag and Ghosting in a Clinical Flat-Panel Selenium Digital Mammography System”, Med. Phys., Aug. 2006, vol. 33, pp. 2998-3005.
J.H. Siewerdsen, “A Ghost Story: Spatio-Temporal Response Characteristics of an Indirect-Detection Flat-Panel Imager”, Med. Phys., Aug. 1999, vol. 26, pp. 1624-1641.
Tong Xu, “Feasibilty of Real Time Dual-Energy Imaging Based on a Flat Panel Detector for Coronary Artery Calcium Quantification”, Med. Phys., Jun. 2006, vol. 33, pp. 1612-1622.
Noor Mail, “Lag Correction Model and Ghosting Analysis for an Indirect-Conversion Flat-Panel Imager”, Journal of Applied Clinical Medical Physics, 2007, vol. 8, pp.
Norr Mail, “An Empirical Method for Lag Correction in Cone-Beam CT”, AAPM Medical Physics, 2007, vol. 94, pp. 2942.
Supplementary European Search Report mailed Jul. 21, 2008 in EP 03 80 9126.
J. Chabbal et al. “Amorphous silicon X-ray image sensor”, Physics of Medical Imaging, vol. SPIE. No. 2708, Feb. 11, 1996, pp. 499-510.

Affiliated with

Also associated with

Rating

Method and apparatus for excess signal correction in an imager does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for excess signal correction in an imager, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for excess signal correction in an imager will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4289200