Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2007-11-06
2007-11-06
Nghiem, Michael (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S117000
Reexamination Certificate
active
10411272
ABSTRACT:
The invention performs an AC stress test assuming the CMOS operation and an AC stress test using a ring oscillator (R.O.) between a DC stress test method using single semiconductor elements and an aging test method. The deterioration of a semiconductor apparatus can be estimated highly precisely by separately performing the AC stress test assuming the CMOS operation on OFF-stress and ON-stress.
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Asano Etsuko
Hayakawa Masahiko
Ikeda Yoshiko
Cherry Stephen J
Nghiem Michael
Robinson Eric J.
Robinson Intellectual Property Law Office P.C.
Semiconductor Energy Laboratory Co,. Ltd.
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