Method and apparatus for examining a subject

X-ray or gamma ray systems or devices – Specific application – Computerized tomography

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

2502521, A61B 600

Patent

active

043520200

ABSTRACT:
In the X-ray CT system, the X-ray detectors vary in output characteristics such as linearity, directivity and radiation quality from one detector to another. To make compensations for such irregularities, a plurality of phantoms of different absorption is prepared in the CT system according to the present invention. Namely, this plurality of phantoms is set one by one in the measuring space in the same manner as in the examination of an examinee or subject to be examined; the coefficient of X-ray absorption is determined for each of these phantoms. Further, theoretical values of absorption for each phantom are compared to the actual absorption measurements on each phantom to provide an absorption error value for each detector at differing absorption levels. The actual subject absorption value for each detector is used to pick the two error values closest to the actual value. The two error values are interpolated or extrapolated to find an error value for correcting the actual absorption value. The above method steps are advantageously implemented by one or more digital computers. The corrected subject absorption values are provided to a conventional image reconstruction device to provide the desired X-ray video image.

REFERENCES:
patent: 3881110 (1975-04-01), Hounsfield et al.
patent: 4028554 (1977-06-01), Hounsfield
patent: 4149247 (1979-04-01), Pavkovich et al.
patent: 4225789 (1980-09-01), Albrecht
patent: 4233507 (1980-11-01), Volz

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for examining a subject does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for examining a subject, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for examining a subject will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-401101

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.