Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Earth science
Patent
1998-01-16
2000-04-04
McElheny, Jr., Donald E.
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Earth science
G06F 1900
Patent
active
060472405
ABSTRACT:
The present invention relates generally to a method and apparatus for evaluating the resistivity of invaded formations at high apparent dip angle. A multi-array induction tool having a plurality of arrays is disposed in a borehole. Signals from a subset of coils of the array are selected to probe different volumes of the formation surrounding the borehole. The maximum entropy method is used to process data from the subset of coils to effectively remove distortions produced by shoulder and dip effect in the presence of shallow, moderate, or deep invasion. An advantage of the invention is a computer program that accurately predicts the response of induction arrays in an assumed layered formation with dip. After processing the data, the resulting multi-array induction log will indicate a conductivity profile for the subset of coils which is substantially identical to that of an array in a thick bed, without dip or layering, with the same invasion profile. A 1D radial inversion of the resulting logs at each point in depth will give a closer estimate of the actual formation parameters, R.sub.xo, R.sub.t, and the invasion radius.
REFERENCES:
patent: 5142472 (1992-08-01), Day
patent: 5157605 (1992-10-01), Chandler et al.
patent: 5184079 (1993-02-01), Barber
patent: 5187661 (1993-02-01), Sinclair
patent: 5210691 (1993-05-01), Freedman, et al.
patent: 5355088 (1994-10-01), Howard, Jr.
patent: 5388044 (1995-02-01), Hepp
patent: 5469062 (1995-11-01), Meyer, Jr.
patent: 5506769 (1996-04-01), Fu et al.
Barber Thomas D.
Broussard Tracy E.
Minerbo Gerald
Sijercic Zlatko
Jeffery Brigitte L.
McElheny Jr. Donald E.
Ryberg John J.
Schlumberger Technology Corporation
Segura Victor H.
LandOfFree
Method and apparatus for evaluating the resistivity of invaded f does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for evaluating the resistivity of invaded f, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for evaluating the resistivity of invaded f will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-373851