Etching a substrate: processes – Nongaseous phase etching of substrate – With measuring – testing – or inspecting
Reexamination Certificate
2007-01-09
2007-01-09
Norton, Nadine (Department: 1765)
Etching a substrate: processes
Nongaseous phase etching of substrate
With measuring, testing, or inspecting
C216S085000, C216S092000, C216S097000
Reexamination Certificate
active
10761080
ABSTRACT:
The apparatus for quantifying effectiveness of solvent to clean a coating from a substrate using a drip test includes a test stand, a drip test device, and a computer associated with the stand and test device. The test stand is adapted to support a glass panel at a predetermined angle. The drip test device is adapted to deposit solvent-based droplets onto a coated surface of the glass panel to clean the coated surface. The computer optically scans the glass panel and to determine cleanliness after a drip test is conducted. The method includes conducting a drip test on a coated glass panel, placing a template behind the glass panel, optically scanning the glass panel and template into a computer, and evaluating the glass panel for cleanliness based on the scanned image of the glass panel and template.
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patent: 5567981 (1996-10-01), Bhansali et al.
patent: 5756885 (1998-05-01), Poku et al.
patent: 2003/0034550 (2003-02-01), Nakatani
patent: 2004/0179193 (2004-09-01), Maezono et al.
GM Engineering Standards Material Specification Pating #9984304, p. 3, section 3.3.4.4, Jun. 2001.
Altman Deborah M.
Marmo Carol A.
Norton Nadine
PPG Industries Ohio Inc.
Tran Binh X
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