Method and apparatus for evaluating impurities in a liquid cryst

Details Method and apparatus for evaluating impurities in a liquid cryst Method and apparatus for evaluating impurities in a liquid cryst

1995-09-28

1997-04-15

Nguyen, Vinh P.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

3241581, G01R 3100

Patent

active

056213344

ABSTRACT:
A liquid crystal device evaluation method including the steps of irradiating infrared a liquid crystal device with light while applying an electric field to the liquid crystal device, and obtaining a field response curve corresponding to a change in infrared light intensity with time by measuring time-profile of infrared light intensity having passed through the liquid crystal layer, wherein an impurity mixed in the liquid crystal device is detected on the basis of the slope of the field response curve which is obtained, when pulsed electric fields having different polarities are applied to the liquid crystal device, within a time corresponding to the pulse width of each pulsed electric field. An apparatus for realizing the evaluation method is also disclosed.

REFERENCES:
patent: 4820977 (1989-04-01), Brust
patent: 4887031 (1989-12-01), Brust
patent: 5268638 (1993-12-01), Brunner et al.
patent: 5339093 (1994-08-01), Kumagai et al.
Koichi Iwata et al., Construction of a versatile microsecond time-resolved infrared spectrometer; Applied Spectroscopy, vol. 44, No. 9, 1990, pp. 1431-1437.

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