Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-06-28
2005-06-28
Tokar, Michael (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
06911837
ABSTRACT:
The present method includes steps of: discharging a droplet of fluid containing fine particles with electric characteristics from an inkjet nozzle onto the microwave integrated circuit formed on a substrate; forming a coat of the fine particles having electric characteristics on the substrate; measuring electric characteristics of the microwave integrated circuit using a probe of a circuit evaluation apparatus before and after forming the coat; and adjusting the electric characteristics of the microwave integrated circuit, so that forming the coat at a desired location on the upper surface of the circuit substrate by scanning an aim of the inkjet nozzle against the circuit substrate enables the microwave integrated circuit to meet the specification.
REFERENCES:
patent: 6113221 (2000-09-01), Weber
patent: 6544484 (2003-04-01), Kaufman et al.
patent: 2001/0039124 (2001-11-01), Shimoda
patent: 2001-274344 (2001-10-01), None
patent: 2002-134878 (2002-05-01), None
patent: 2002-324966 (2002-11-01), None
patent: 2003-86584 (2003-03-01), None
patent: 2003-133692 (2003-05-01), None
Amasuga Hirotaka
Ishikawa Takahide
Kunii Tetsuo
Suzuki Satoshi
Yamamoto Yoshitsugu
Mitsubishi Denki & Kabushiki Kaisha
Nguyen Trung Q.
Tokar Michael
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