Method and apparatus for equalizer testing

Details Method and apparatus for equalizer testing Method and apparatus for equalizer testing

2011-05-31

2011-05-31

Tang, Minh N (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S750010

Reexamination Certificate

active

07952376

ABSTRACT:
Method and apparatus are disclosed related to testing and testability of adaptive equalization circuitry. Where an equalization circuit is provided in an IC, a modified internal loopback provides a testing signal. A local comparator circuit with flexible connectivity offers analog signal testing analysis in conjunction with a low-cost external tester. Flexible use and connectivity of the comparator and external connection points, and block isolation circuitry make accurate, faster, and lower cost testing methods possible.

REFERENCES:
patent: 5337316 (1994-08-01), Weiss et al.
patent: 5953372 (1999-09-01), Virzi
patent: 7200170 (2007-04-01), Desandoli et al.
Wong, W. et al., “Digitally Assisted Adaptive Equalizer in 90 nm With Wide Range Support From 2.5 Gbps-6.5 Gbps,” DesignCon, 2007.
Azais, F. et al., “An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs,” IEEE, Jan.-Feb. 2003, pp. 60-67.

Affiliated with

Also associated with

Rating

Method and apparatus for equalizer testing does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for equalizer testing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for equalizer testing will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2691552