Data processing: measuring – calibrating – or testing – Measurement system – Accelerometer
Reexamination Certificate
2006-12-19
2006-12-19
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Accelerometer
Reexamination Certificate
active
07152014
ABSTRACT:
An input device includes a sensor configured to generate a signal related to a change in inertia around at least one axis of the input device in response to a contacting of the input device. A processor is configured to receive the signal from the sensor to determine whether the change in inertia around the at least one axis of the input device corresponds to a tapping of the input device. The processor is further configured to identify a contacted region of the input device based on a direction of the change in inertia around the at least one axis of the input device when the change in inertia corresponds to a tapping of the input device
REFERENCES:
patent: 6369794 (2002-04-01), Sakurai et al.
patent: 2002/0167699 (2002-11-01), Verplaetse et al.
patent: 2002-133369 (2002-05-01), None
Bang Won-chul
Chang Wook
Cho Joon-kee
Cho Sung-jung
Choi Eun-seok
Barlow John
Buchanan & Ingersoll & Rooney PC
Khuu Cindy D.
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