Method and apparatus for entering a test mode of an externally n

Details Method and apparatus for entering a test mode of an externally n Method and apparatus for entering a test mode of an externally n

1996-09-24

1999-05-04

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324763, G01R 3128

Patent

active

059007397

ABSTRACT:
A method and apparatus of triggering a device, such a pin limited integrated circuit, to enter a test mode includes embedding a circuit into the device to detect the presence of signal conditions not encountered in normal operation. Pre-defined ones of such signal conditions when detected cause the device to activate one or more test modes by generating one or more internal test signals.

REFERENCES:
patent: 4398146 (1983-08-01), Draheim et al.
patent: 5111136 (1992-05-01), Kawashima
patent: 5161159 (1992-11-01), McClure et al.
patent: 5432440 (1995-07-01), Bartlett

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