Method and apparatus for enhanced gauge resolution

Details Method and apparatus for enhanced gauge resolution Method and apparatus for enhanced gauge resolution

1995-10-24

1997-05-20

Noland, Thomas P.

Measuring and testing

Instrument mechanism or transmission

36416701, 364575, 364579, G01D 102

Patent

active

056314302

ABSTRACT:
An instrument cluster gauge system includes a gauge, a microcontroller for sampling a parameter value, and a low resolution digital gauge driver responsive to the microcontroller but capable of only a limited number of output drive signals corresponding to fixed gauge positions. The gauge is driven to positions between the fixed positions by rapidly alternating the drive signal between neighboring fixed positions, so that the gauge responds to the average value of the signal. An algorithm determines the relative number of each of the neighboring positions in the drive signal needed to attain an average signal near the parameter value. Smoothness and accuracy are enhanced.

REFERENCES:
patent: 3633200 (1972-01-01), Ellison et al.
patent: 3691845 (1972-09-01), Ladine
patent: 3889540 (1975-06-01), Widmer
patent: 4133039 (1979-01-01), Eichenlaub
patent: 4686510 (1987-08-01), Baker

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