Method and apparatus for enhanced contact and via lithography

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

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430322, 430394, G03F 900

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active

055320902

ABSTRACT:
An enhanced method and apparatus for forming openings in a photosensitive layer. Using a standard microlithographic printer such as stepper or scan and step system, an unpatterned photosensitive layer is exposed to a first mask having an opening pattern with dimensions within tight (for a given technology generation) process tolerances. Next, prior to development, the photosensitive layer is exposed to a second mask having a grid of clear spaces, surrounding the opening pattern. The combined exposure to the first and second mask forms a latent image of a reduced dimension opening. By the use of two exposures, with the exposure dose for each designed such that intensity profile is easily controllable in the presence of uncontrollable equipment imperfections and process variations, a reduced dimension opening can be formed in a highly manufacturable process with opening sizes smaller than that achievable through conventional lithographic techniques.

REFERENCES:
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patent: 5308741 (1994-05-01), Kemp
patent: 5424154 (1995-06-01), Borodovsky
M. Helm, W. Kavanaugh, B. K. Liew, C. Petti, A. Stolmeijer, M. Ben-tzur, J. Bornstein, J. Lilygren, W. Ting, P. Trammel, J. Allan, G. Gray, M. Hartranft, S. Radigan, J. K. Shanmugan, R. Shrivastave, "A Low Cost Processor Compatible, 18.4 um2, 6-T Bulk Cell Technology For High Speed SRAMS," Cypress Semiconductor Corp., pp. 65-66, 1993 Symposium On VLSI Technology Digest of Technical Papers, May 17-19, 1993, The Japan Society of Applied Physics and the IEEE Electron Devices Society.

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