Method and apparatus for engineering a testability...

Details Method and apparatus for engineering a testability... Method and apparatus for engineering a testability...

2007-12-11

2007-12-11

Benson, Walter (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

C324S1540PB

Reexamination Certificate

active

11188080

ABSTRACT:
A method and apparatus is presented for gaining socket testability through the use of a capacitive interposer engineered to create capacitive coupling between signal nodes of a circuit assembly that the tester has access to and nodes of the socket that would not otherwise have any coupling to a testable signal node of the socket. Generally, coupling capacitance is engineered into the interposer by trace and via routing between the signal node of the socket and a location in close proximity to the inaccessible socket node such that their proximity to each other couples them together.

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