Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1994-06-14
1996-09-10
Gonazlez, Frank
Optics: measuring and testing
By particle light scattering
With photocell detection
356349, 356357, G01B 902, G01B 1102
Patent
active
055550878
ABSTRACT:
A low coherence light beam is split into first and second light beams, and the frequency of the first light beam is shifted. The first and second light beams are then combined with each other at a position at which the optical path difference between the two light beams is larger than the coherence length of the low coherence light beam. The combined light beam is guided to a position in the vicinity of a medium having light scattering properties and split into a third light beam, which travels reversely to the direction of travel of the combined light beam, and a fourth light beam, which is irradiated to the medium. A light beam scattered backwardly from a predetermined depth in the medium is caused to interfere with the third light beam, and the intensity of the resulting interference light beam is detected. Optical heterodyne detection of the intensity of the backward scattered light beam is carried out in accordance with the detected intensity of the interference light beam, and information representing the microstructure of the predetermined deed portion in the medium is thereby obtained.
REFERENCES:
patent: 4627731 (1986-12-01), Waters et al.
patent: 4892406 (1990-01-01), Waters
patent: 5293215 (1994-03-01), Pfendler et al.
patent: 5321501 (1994-06-01), Swanson et al.
patent: 5343290 (1994-08-01), Batchelder et al.
"Science", David Huang, et al., 1991, vol. 254, pp. 1178-1181.
Miyagawa Ichirou
Toida Masahiro
Eisenberg Jason D.
Fuji Photo Film Co. , Ltd.
Gonazlez Frank
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