Method and apparatus for eliminating automated testing...

Details Method and apparatus for eliminating automated testing... Method and apparatus for eliminating automated testing...

2005-10-28

2008-05-27

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S755090, C324S1540PB

Reexamination Certificate

active

07378862

ABSTRACT:
The present invention eliminates the indexing time of an SOC tester, or at least reduces it to the time delay for an electronic switch to toggle or a mechanical shift to occur between two banks of DUTs to be tested on a DUT load board mounted on a test head.

REFERENCES:
patent: 6731127 (2004-05-01), Watts
patent: 6903567 (2005-06-01), Chung et al.
patent: 7151388 (2006-12-01), Gopal et al.
patent: 7235993 (2007-06-01), Luk
patent: 2005/0168233 (2005-08-01), Roberts et al.

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