Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1992-03-17
1993-12-28
Nguyen, Vinh
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324 96, G01R 2912
Patent
active
052743250
ABSTRACT:
A method for electro-optic sampling measurement of electrical signals in integrated circuits, capable of improving the reproducibility of the measurements and calibrating the voltage accurately. The changes of beam intensity of a laser beam reflected from an electro-optic probe is measured by using a low frequency signal of a known voltage level to determine a relationship between the changes of beam intensity and gaps between the electro-optic probe and the integrated circuit, then a proportionality of the change of beam intensity and an absolute voltage level for a desired gap is determined according to the determined relationship. Then, the change of beam of intensity at a desired measurement position with a desired gap is measured by using a high frequency signal and the absolute voltage level of the high frequency signal is determined according to the measured change of beam intensity and the determined proportionality. The electro-optic probe is positioned by first bringing the electro-optic probe into a contact with the integrated circuit to detect a contact position, and then moving the electro-optic probe away from the integrated circuit to provide a desired gap with respect to the detected contact position regarded as a reference point.
REFERENCES:
patent: 4603293 (1986-07-01), Mourou et al.
patent: 4857836 (1989-08-01), Soelkner
patent: 4891580 (1990-01-01), Valdmanis
patent: 4941753 (1990-07-01), Wickramasighe
patent: 5065103 (1991-11-01), Slinkman et al.
Valdmanis, "1 THz-Bandwidth Prober For High-Speed Devices And Integrated Cirtcuits", Electronics Letters, vol. 23, No. 24, Nov. 19, 1987, pp. 1308-1310.
Nagatsuma Tadao
Shinagawa Mitsuru
Nguyen Vinh
Nippon Telegraph and Telephone Corporation
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