Method and apparatus for electrically testing radiation suscepti

Details Method and apparatus for electrically testing radiation suscepti Method and apparatus for electrically testing radiation suscepti

1980-02-19

1982-04-06

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158D, G01R 3126

Patent

active

043238424

ABSTRACT:
A method and apparatus are disclosed for testing susceptibility of a gate insulator in MOS and MIS devices to irradiation without use of ionizing radiation. The method consists of simulating the effects of radiation by applying a high magnitude, pulsed electric field to the device under test. An apparatus capable of determining the relationship between voltage applied to the device under test and the device capacitance is used to provide the desired susceptibility information.

REFERENCES:
Sze, S. M.; "Physics of Semiconductor Devices"; Wiley-Interscience, New Y, N.Y.; 1969; pp. 477-479.
Aitken et al.; "Avalanche . . . "; IEEE Trans. on Nuc. Sci.; vol. NS-24; No. 6; Dec. 1977; pp. 2128-2134.

Affiliated with

Also associated with

Rating

Method and apparatus for electrically testing radiation suscepti does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for electrically testing radiation suscepti, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for electrically testing radiation suscepti will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-594994