Method and apparatus for electrical test of wiring patterns form

Details Method and apparatus for electrical test of wiring patterns form Method and apparatus for electrical test of wiring patterns form

1996-07-25

1998-04-28

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324519, 324754, G01R 3102

Patent

active

057449643

ABSTRACT:
For a print-circuit board 10 of a good product, probes 31 and 32 are made to be electrically continuous with a ground plate 13 and a wiring pattern i respectively to measure a capacitance Cgi, which is then stored in a storage device 44. A capacitance Ci of a print-circuit board 10, the object of testing, is measured in a similar manner and a ratio .mu.=(average value Ca of a several measured capacitance value of the object of testing/(average value Cga of the corresponding measured capacitance values of the good product) is calculated. If Ci<Cgj(1-.DELTA.e0) or Ci>Cgj(1+.DELTA.e0), the measured capacitance values Ci and Cgjare excluded from the objects of calculation of the average values. If Cj<.mu..Cgj(1-.DELTA.e) or Cj>.mu..Cgj(1+.DELTA.e), a wiring j is judged to be defective and the resistance measuring method is employed to judge the details of the defect. The tolerance rate .DELTA.e0 and .DELTA.e are 0.15 and 0.02 respectively.

REFERENCES:
patent: 4565996 (1986-01-01), Burr et al.
patent: 5006808 (1991-04-01), Watts
patent: 5138266 (1992-08-01), Stearns
patent: 5187430 (1993-02-01), Marek et al.
patent: 5363048 (1994-11-01), Modlin et al.
patent: 5570027 (1996-10-01), Stans et al.
patent: 5596283 (1997-01-01), Mellitz et al.

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