Method and apparatus for electrical test of CMOS pixel sensor ar

Details Method and apparatus for electrical test of CMOS pixel sensor ar Method and apparatus for electrical test of CMOS pixel sensor ar

1997-12-08

2000-09-12

Garber, Wendy

Television

Camera, system and detail

Solid-state image sensor

348181, H04N 5335, H04N 1700

Patent

active

061184829

ABSTRACT:
CMOS pixel sensors have been of interest as replacements for CCD's in imaging applications. Such devices promise lower power and simpler system level design through fewer power supply voltages and higher functional integration. It is difficult and cost ineffective to utilize images to test active pixel sensors. Here, a method and apparatus for electrical testing of CMOS pixel sensors is described which involves electrically writing a pattern into the CMOS pixel sensors for the detection of adjacent cell shorts or stuck at faults as well as verification of read-channel circuit functionality and performance. The invention provides for an electrical testing of CMOS pixel array that is simple, time efficient and cost effective for use in, for example, production.

REFERENCES:
patent: 4326219 (1982-04-01), Griesshaber
patent: 5535011 (1996-07-01), Yamagami et al.
patent: 5892541 (1999-04-01), Merrill
Iida et al.; "A 1/4-Inch 330k Square Pixel Progressive Scan CMOS Active Pixel IMage Sensor", IEEE Journal of Solid-State Circuits, vol. 32, No. 11, Nov. 1997.

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