Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1996-04-18
1999-07-27
Nguyen, Vinh P.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324765, G01R 104, H01R 1366
Patent
active
059296496
ABSTRACT:
The present method and apparatus for electrically characterizing a pin grid array includes a plurality of conductive caps which may be removably fitted over chosen pins of the pin grid array, and a conductive fixture having a plurality of passages therethrough which correspond to the pins of the pin grid array. The passages are sized so that the caps come in close proximity to the fixture with the fixture so positioned on the pin grid array, while each pin which does not have a cap thereon is not in contact with the fixture but defines an air gap with the fixture. Electrical probing may then take place between the fixture, which connects a number of pins through the caps, and a pin not in contact with the fixture to gain electrical characterization information of the pin grid array.
REFERENCES:
patent: 4046445 (1977-09-01), Anhalt
patent: 4668041 (1987-05-01), La Komski et al.
patent: 4866375 (1989-09-01), Malloy
patent: 5451883 (1995-09-01), Staab
"Jedec Standard Proposal LCZ Measurement Method", May 17, 1995, pp. 1-20.
Advanced Micro Devices , Inc.
Kwok Edward C.
Nguyen Vinh P.
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