Method and apparatus for educational testing

Education and demonstration – Question or problem eliciting response – Grading of response form

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C707S770000, C715S700000

Reexamination Certificate

active

08086167

ABSTRACT:
Methods and apparatuses are disclosed for computer-based evaluation of a test-taker's performance with respect to a reward threshold. A performance assessment of the test taker can be standardized or customized, as well as relative or absolute. The system allows a parentally-controlled reward system such that children who reach specified objectives can claim an award that parents are confident was fairly and honestly earned without the parent being required to proctor the testing.

REFERENCES:
patent: 4658093 (1987-04-01), Hellman
patent: 4967354 (1990-10-01), Buchanan
patent: 4978305 (1990-12-01), Kraft
patent: 5036461 (1991-07-01), Elliott et al.
patent: 5050212 (1991-09-01), Dyson
patent: 5059127 (1991-10-01), Lewis et al.
patent: 5083271 (1992-01-01), Thacher et al.
patent: 5112051 (1992-05-01), Darling et al.
patent: 5155680 (1992-10-01), Wiedemer
patent: 5193114 (1993-03-01), Moseley
patent: 5243652 (1993-09-01), Teare et al.
patent: 5243654 (1993-09-01), Hunter
patent: 5259029 (1993-11-01), Duncan, Jr.
patent: 5259766 (1993-11-01), Sack et al.
patent: 5288978 (1994-02-01), Iijima
patent: 5319710 (1994-06-01), Atalla et al.
patent: 5321611 (1994-06-01), Clark et al.
patent: 5347580 (1994-09-01), Molva et al.
patent: 5349642 (1994-09-01), Kingdon
patent: 5351293 (1994-09-01), Michener et al.
patent: 5355413 (1994-10-01), Ohno
patent: 5359510 (1994-10-01), Sabaliauskas
patent: 5377268 (1994-12-01), Hunter
patent: 5386468 (1995-01-01), Akiyama et al.
patent: 5400319 (1995-03-01), Fite et al.
patent: 5412575 (1995-05-01), Constant et al.
patent: 5416840 (1995-05-01), Cane et al.
patent: 5434918 (1995-07-01), Kung et al.
patent: 5466159 (1995-11-01), Clark et al.
patent: 5513994 (1996-05-01), Kershaw et al.
patent: 5565316 (1996-10-01), Kershaw et al.
patent: 5615359 (1997-03-01), Yung
patent: 5718591 (1998-02-01), Clark et al.
patent: 5743746 (1998-04-01), Ho et al.
patent: 5752836 (1998-05-01), Clark et al.
patent: 5768382 (1998-06-01), Schneier et al.
patent: 5820386 (1998-10-01), Sheppard, II
patent: 5827070 (1998-10-01), Kershaw et al.
patent: 5904485 (1999-05-01), Siefert
patent: 5947747 (1999-09-01), Walker et al.
patent: 5970143 (1999-10-01), Schneier et al.
patent: 6149438 (2000-11-01), Richard et al.
patent: 7483670 (2009-01-01), Walker et al.
Website: “NCS MicroTest Score II Plus”, National Computer Systems, Inc., (http llwww ncsinternational com
cscorp/education/m-test2 htm), Copyright 1997, 3 pp.
Website: “Test Scoring/Optical Scanning”, University of Maryland Academic Information Services, (http //www aits umd edu/faculty—staff/test html), download date: Jul. 28, 1998., 2 pp.
Website: “Test Scoring Results Available Through Email”, (http //www uww edu/STIR/apr96/5Test htm), download date: Jul. 28, 1998, 1 pg.
Notice of Allowance for U.S. Appl. No. 10/242,490, 8 pp.
Interview Summary for U.S. Appl. No. 10/242,490, mailed Jul. 28, 2008, 2 pp.
Office Action for U.S. Appl. No. 10/242,490, mailed Jul. 25, 2007, 16 pp.
Office Action for U.S. Appl. No. 10/242,490, mailed Nov. 21, 2006, 10 pp.
Advisory Action for U.S. Appl. No. 10/242,490, mailed Nov. 23, 2005, 4 pp.
Office Action for U.S. Appl. No. 10/242,490, mailed Aug. 3, 2005, 9 pp.
Office Action for U.S. Appl. No. 10/242,490, mailed Jan. 27, 2005, 7 pp.
Defendants Answer to Plaintiffs Complaint,Walker Digital LLC. v.CompassLearning, Inc. et al., No. 00-308 (Del. Apr. 11, 2011), 14 pp.
Defendants Answer to Plaintiffs Complaint,Walker Digital LLC. v.CompassLearning, Inc. et al., No. 00-308 (Del. Apr. 11, 2011), 13 pp.
Office Action for U.S. Appl. No. 10/242,490, mailed Feb. 15, 2008, 14 pp.
Interview Summary for U.S. Appl. No. 10/242,490, mailed Apr. 18, 2005, 3 pp.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for educational testing does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for educational testing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for educational testing will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4271140

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.