Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-08-07
2007-08-07
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C345S418000
Reexamination Certificate
active
11442431
ABSTRACT:
In one embodiment, a computer-implemented method 1) determines a current configuration of instruments which are connected in a user's test system; 2) retrieves an icon associated with each instrument (the icons being sized proportionally to the instruments they represent); 3) displays the icons within a GUI; and 4) graphically connects the icons within the GUI, in accord with the current configuration of instruments. In another embodiment, a computer-implemented method 1) determines a current configuration of instruments which are connected in a user's test system; 2) retrieves an icon associated with each instrument (the icons being pictures of the instruments); 3) displays the icons within a GUI; and 4) graphically connects the icons within the GUI, in accord with the current configuration of instruments. Other embodiments are also disclosed.
REFERENCES:
patent: 6052130 (2000-04-01), Bardon et al.
patent: 7043393 (2006-05-01), Fuller, III et al.
patent: 2003/0101025 (2003-05-01), Shah et al.
patent: 2005/0278129 (2005-12-01), Benvenga et al.
Benvenga Carl E.
Wubbena William Hobson
Agilent Technologie,s Inc.
Raymond Edward
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