Method and apparatus for dimensional analysis and flaw detection

Details Method and apparatus for dimensional analysis and flaw detection Method and apparatus for dimensional analysis and flaw detection

1985-05-09

1988-02-16

Gruber, Felix D.

Boots, shoes, and leggings

73627, 378 20, 378 58, G01N 2302, G01B 1506, G06F 1546

Patent

active

047259639

ABSTRACT:
An apparatus and method of non-contacting, non-destructive, on-line dimensional analysis and flaw detection of tubular products are disclosed. The apparatus includes penetrating radiation sources and detectors arranged about the product to be examined and a high-speed data processing system which employs novel computed tomography techniques to provide high precision dimensional estimates and flaw detection. The apparatus is capable of continuously determining the outside diameter, inside diameter, wall thickness, ovality, eccentricity, and weight-per-foot over a wide range of temperatures for essentially tubular products produced on a unit or continuous basis. The apparatus can also detect process-induced flaws in the products.

REFERENCES:
patent: 2462088 (1949-02-01), Friedman
patent: 3109095 (1963-10-01), Van Horne
patent: 4187425 (1980-02-01), Thompson
patent: 4284895 (1981-08-01), Morgan et al.
patent: 4393305 (1983-07-01), Shimizu et al.
patent: 4437006 (1984-03-01), Morgan et al.
patent: 4600998 (1986-07-01), Huet

Affiliated with

Also associated with

Rating

Method and apparatus for dimensional analysis and flaw detection does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for dimensional analysis and flaw detection, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for dimensional analysis and flaw detection will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2224600