Method and apparatus for digital calibration of an...

Details Method and apparatus for digital calibration of an... Method and apparatus for digital calibration of an...

2008-05-27

2008-05-27

Mai, Lam T (Department: 2819)

Coded data generation or conversion

Converter calibration or testing

C341S155000

Reexamination Certificate

active

11714361

ABSTRACT:
Method and apparatus for digital calibration of an analog-to-digital converter (ADC). One example relates to calibrating an analog-to-digital (A/D) conversion system having an N-bit resolution. The A/D conversion system includes an ADC that generates an output having N most significant bits (MSBs) and M least significant bits (LSBs) (i.e., an N+M bit resolution). An offset calibration circuit is configured to determine an offset in the ADC and to compensate the N+M bit output using the offset to provide an N+M bit offset corrected output. A gain calibration circuit is configured to determine a gain correction factor for the ADC and to compensate the N+M bit offset corrected output using the gain correction factor to provide an N bit offset and gain corrected output.

REFERENCES:
patent: 6081215 (2000-06-01), Kost et al.
patent: 6351228 (2002-02-01), Kutsuno et al.
patent: 6509852 (2003-01-01), Todsen et al.
patent: 6784824 (2004-08-01), Quinn
patent: 6809678 (2004-10-01), Vera et al.

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